Charter

Covers conferences:
ICQNM, ICONS, ICIMP, SENSORCOMM, CENICS, VALID, SIMUL, INFOCOMP
issn: 1942-261x

The journal aims to special topics on systems and measurements, including nano- and micro-systems and techniques, advanced and specialized systems (expert systems, tutoring systems, decision systems), validation systems, embedded systems, and large industrial systems. Instrumentation and measurement techniques including wired and wireless sensors, special electronics, and instrumentation for networks and service protection are also a target.

Additional special topics may concern nano-robotics, safety for industrial systems, implantable and wearable devices, organic optoelectronics, performance metrics and measurements, disaster prevention and recovery, and user safety, privacy and protection.

Editor-in-Chief

Constantin Paleologu, University "Politehnica" of Bucharest, Romania

Editorial Advisory Board

Vladimir Privman, Clarkson University - Potsdam, USA
Go Hasegawa, Osaka University, Japan
Winston KG Seah, Institute for Infocomm Research (Member of A*STAR), Singapore
Ken Hawick, Massey University - Albany, New Zealand

Editorial Board

Jemal Abawajy, Deakin University, Australia
Ermeson Andrade, Universidade Federal de Pernambuco (UFPE), Brazil
Al-Khateeb Anwar, Politecnico di Torino, Italy
Francisco Arcega, Universidad Zaragoza, Spain
Tulin Atmaca, Telecom SudParis, France
Rafic Bachnak, Texas A&M International University, USA
Lubomír Bakule, Institute of Information Theory and Automation of the ASCR, Czech Republic
Nicolas Belanger, Eurocopter Group, France
Lotfi Bendaouia, ETIS-ENSEA, France
Partha Bhattacharyya, Bengal Engineering and Science University, India
Karabi Biswas, Indian Institute of Technology - Kharagpur, India
Jonathan Blackledge, Dublin Institute of Technology, UK
Dario Bottazzi, Laboratori Guglielmo Marconi, Italy
Diletta Romana Cacciagrano, University of Camerino, Italy
Javier Calpe, Analog Devices and University of Valencia, Spain
Jaime Calvo-Gallego, University of Salamanca, Spain
Maria-Dolores Cano Baños, Universidad Politécnica de Cartagena,Spain
Juan-Vicente Capella-Hernández, Universitat Politècnica de València, Spain
Berta Carballido Villaverde, Cork Institute of Technology, Ireland
Vítor Carvalho, Minho University & IPCA, Portugal
Irinela Chilibon, National Institute of Research and Development for Optoelectronics, Romania
Soolyeon Cho, North Carolina State University, USA
Hugo Coll Ferri, Polytechnic University of Valencia, Spain
Denis Collange, Orange Labs, France
Noelia Correia, Universidade do Algarve, Portugal
Pierre-Jean Cottinet, INSA de Lyon - LGEF, France
Marc Daumas, University of Perpignan, France
Jianguo Ding, University of Luxembourg, Luxembourg
António Dourado, University of Coimbra, Portugal
Daniela Dragomirescu, LAAS-CNRS / University of Toulouse, France
Matthew Dunlop, Virginia Tech, USA
Mohamed Eltoweissy, Pacific Northwest National Laboratory / Virginia Tech, USA
Paulo Felisberto, LARSyS, University of Algarve, Portugal
Miguel Franklin de Castro, Federal University of Ceará, Brazil
Mounir Gaidi, Centre de Recherches et des Technologies de l'Energie (CRTEn), Tunisie
Eva Gescheidtova, Brno University of Technology, Czech Republic
Tejas R. Gandhi, Virtua Health-Marlton, USA
Teodor Ghetiu, University of York, UK
Franca Giannini, IMATI - Consiglio Nazionale delle Ricerche - Genova, Italy
Gonçalo Gomes, Nokia Siemens Networks, Portugal
João V. Gomes, University of Beira Interior, Portugal
Luis Gomes, Universidade Nova Lisboa, Portugal
Antonio Luis Gomes Valente, University of Trás-os-Montes and Alto Douro, Portugal
Diego Gonzalez Aguilera, University of Salamanca - Avila, Spain
Genady Grabarnik,CUNY - New York, USA
Craig Grimes, Nanjing University of Technology, PR China
Stefanos Gritzalis, University of the Aegean, Greece
Richard Gunstone, Bournemouth University, UK
Jianlin Guo, Mitsubishi Electric Research Laboratories, USA
Mohammad Hammoudeh, Manchester Metropolitan University, UK
Petr Hanáček, Brno University of Technology, Czech Republic
Go Hasegawa, Osaka University, Japan
Henning Heuer, Fraunhofer Institut Zerstörungsfreie Prüfverfahren (FhG-IZFP-D), Germany
Paloma R. Horche, Universidad Politécnica de Madrid, Spain
Vincent Huang, Ericsson Research, Sweden
Friedrich Hülsmann, Gottfried Wilhelm Leibniz Bibliothek - Hannover, Germany
Travis Humble, Oak Ridge National Laboratory, USA
Florentin Ipate, University of Pitesti, Romania
Imad Jawhar, United Arab Emirates University, UAE
Terje Jensen, Telenor Group Industrial Development, Norway
Liudi Jiang, University of Southampton, UK
Kenneth B. Kent, University of New Brunswick, Canada
Fotis Kerasiotis, University of Patras, Greece
Andrei Khrennikov, Linnaeus University, Sweden
Alexander Klaus, Fraunhofer Institute for Experimental Software Engineering (IESE), Germany
Andrew Kusiak, The University of Iowa, USA
Vladimir Laukhin, Institució Catalana de Recerca i Estudis Avançats (ICREA) / Institut de Ciencia de Materials de Barcelona (ICMAB-CSIC), Spain
Kevin Lee, Murdoch University, Australia
Andreas Löf, University of Waikato, New Zealand
Jerzy P. Lukaszewicz, Nicholas Copernicus University - Torun, Poland
Zoubir Mammeri, IRIT - Paul Sabatier University - Toulouse, France
Sathiamoorthy Manoharan, University of Auckland, New Zealand
Stefano Mariani, Politecnico di Milano, Italy
Paulo Martins Pedro, Chaminade University, USA / Unicamp, Brazil
Daisuke Mashima, Georgia Institute of Technology, USA
Don McNickle, University of Canterbury, New Zealand
Mahmoud Meribout, The Petroleum Institute - Abu Dhabi, UAE
Luca Mesin, Politecnico di Torino, Italy
Marco Mevius, HTWG Konstanz, Germany
Marek Miskowicz, AGH University of Science and Technology, Poland
Jean-Henry Morin, University of Geneva, Switzerland
Fabrice Mourlin, Paris 12th University, France
Adrian Muscat, University of Malta, Malta
Mahmuda Naznin, Bangladesh University of Engineering and Technology, Bangladesh
George Oikonomou, University of Bristol, UK
Arnaldo S. R. Oliveira, Universidade de Aveiro-DETI / Instituto de Telecomunicações, Portugal
Aida Omerovic, SINTEF ICT, Norway
Victor Ovchinnikov, Aalto University, Finland
Telhat Özdoğan, Recep Tayyip Erdogan University, Turkey
Gurkan Ozhan, Middle East Technical University, Turkey
Constantin Paleologu, University Politehnica of Bucharest, Romania
Matteo G A Paris, Universita` degli Studi di Milano,Italy
Vittorio M.N. Passaro, Politecnico di Bari, Italy
Giuseppe Patanè, CNR-IMATI, Italy
Marek Penhaker, VSB- Technical University of Ostrava, Czech Republic
Juho Perälä, VTT Technical Research Centre of Finland, Finland
Florian Pinel, T.J.Watson Research Center, IBM, USA
Ana-Catalina Plesa, German Aerospace Center, Germany
Miodrag Potkonjak, University of California - Los Angeles, USA
Alessandro Pozzebon, University of Siena, Italy
Vladimir Privman, Clarkson University, USA
Konandur Rajanna, Indian Institute of Science, India
Stefan Rass, Universität Klagenfurt, Austria
Candid Reig, University of Valencia, Spain
Teresa Restivo, University of Porto, Portugal
Leon Reznik, Rochester Institute of Technology, USA
Gerasimos Rigatos, Harper-Adams University College, UK
Luis Roa Oppliger, Universidad de Concepción, Chile
Ivan Rodero, Rutgers University - Piscataway, USA
Lorenzo Rubio Arjona, Universitat Politècnica de València, Spain
Claus-Peter Rückemann, Leibniz Universität Hannover / Westfälische Wilhelms-Universität Münster / North-German Supercomputing Alliance, Germany
Subhash Saini, NASA, USA
Mikko Sallinen, University of Oulu, Finland
Christian Schanes, Vienna University of Technology, Austria
Rainer Schönbein, Fraunhofer Institute of Optronics, System Technologies and Image Exploitation (IOSB), Germany
Guodong Shao, National Institute of Standards and Technology (NIST), USA
Dongwan Shin, New Mexico Tech, USA
Larisa Shwartz, T.J. Watson Research Center, IBM, USA
Simone Silvestri, University of Rome "La Sapienza", Italy
Diglio A. Simoni, RTI International, USA
Radosveta Sokullu, Ege University, Turkey
Junho Song, Sunnybrook Health Science Centre - Toronto, Canada
Leonel Sousa, INESC-ID/IST, TU-Lisbon, Portugal
Arvind K. Srivastav, NanoSonix Inc., USA
Grigore Stamatescu, University Politehnica of Bucharest, Romania
Raluca-Ioana Stefan-van Staden, National Institute of Research for Electrochemistry and Condensed Matter, Romania
Pavel Šteffan, Brno University of Technology, Czech Republic
Monika Steinberg, University of Applied Sciences and Arts Hanover, Germany
Chelakara S. Subramanian, Florida Institute of Technology, USA
Sofiene Tahar, Concordia University, Canada
Jaw-Luen Tang, National Chung Cheng University, Taiwan
Muhammad Tariq, Waseda University, Japan
Roald Taymanov, D.I.Mendeleyev Institute for Metrology, St.Petersburg, Russia
Francesco Tiezzi, IMT Institute for Advanced Studies Lucca, Italy
Theo Tryfonas, University of Bristol, UK
Wilfried Uhring, University of Strasbourg // CNRS, France
Guillaume Valadon, French Network and Information and Security Agency, France
Eloisa Vargiu, Barcelona Digital - Barcelona, Spain
Miroslav Velev, Aries Design Automation, USA
Dario Vieira, EFREI, France
Stephen White, University of Huddersfield, UK
Shengnan Wu, American Airlines, USA
Xiaodong Xu, Beijing University of Posts & Telecommunications, China
Ravi M. Yadahalli, PES Institute of Technology and Management, India
Yanyan (Linda) Yang, University of Portsmouth, UK
Shigeru Yamashita, Ritsumeikan University, Japan
Patrick Meumeu Yomsi, INRIA Nancy-Grand Est, France
Alberto Yúfera, Centro Nacional de Microelectronica (CNM-CSIC) - Sevilla, Spain
Sergey Y. Yurish, IFSA, Spain
David Zammit-Mangion, University of Malta, Malta
Guigen Zhang, Clemson University, USA
Weiping Zhang, Shanghai Jiao Tong University, P. R. China
J Zheng-Johansson, Institute of Fundamental Physic Research, Sweden

 
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