Charter

Covers conferences:
ICQNM, ICONS, ICIMP, SENSORCOMM, ENICS
issn: 1942-261x

The journal aims to special topics on systems and measurements, including nano- and micro-systems and techniques, advanced and specialized systems (expert systems, tutoring systems, decision systems), validation systems, embedded systems, and large industrial systems. Instrumentation and measurement techniques including wired and wireless sensors, special electronics, and instrumentation for networks and service protection are also a target.

Additional special topics may concern nano-robotics, safety for industrial systems, implantable and wearable devices, organic optoelectronics, performance metrics and  measurements, disaster prevention and recovery, and user safety, privacy and protection.

Editorial Board

(to be announced)